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Memorial in Jena, Germany to Ernst Karl Abbe, who approximated the diffraction limit of a microscope as = , where d is the resolvable feature size, λ is the wavelength of light, n is the index of refraction of the medium being imaged in, and θ (depicted as α in the inscription) is the half-angle subtended by the optical objective lens (representing the numerical aperture).
The same microscope without a corrector would have C s = 0.5 mm and thus a 200 pm cut-off. [107] The spherical aberrations are suppressed to the third or fifth order in the "aberration-corrected" microscopes. Their resolution is however limited by electron source geometry and brightness and chromatic aberrations in the objective lens system ...
Image of reconstruction on a clean surface of gold. A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. . Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Differential interference contrast microscopy, Hoffman modulation-contrast microscopy, Quantitative phase-contrast microscopy Phase-contrast microscopy (PCM) is an optical microscopy technique that converts phase shifts in light passing through a transparent specimen to brightness changes in the image.
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